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Analog Devices
AD5722RBREZ-REEL7
Complete, Dual, 12-Bit, Serial Input, Unipolar/Bipolar, Voltage Output DAC
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Newark1618.4214.6113.07Visit Site
Analog Devices24017.0611.9879.3125Visit Site
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Weyland Electronics Group Pte. Ltd.1,00013.823Visit Site
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Description

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The AD5722R / AD5732R / AD5752R are dual, 12-/14-/16-bit,serial input, voltage output digital-to-analog converters. They operate from single supply voltages of +4.5 V up to +16.5 V or dual supply voltages from ±4.5 V up to ±16.5 V. Nominal full scale output range is software selectable from +5 V, +10 V, +10.8 V, ±5 V, ±10 V, or ±10.8 V. Integrated output amplifiers, reference buffers, and proprietary power-up/power-down control circuitry are also provided. The parts offer guaranteed monotonicity, integral nonlinearity (INL) of ±16 LSB maximum, low noise, 10 μs maximum settling time, and an on-chip +2.5 V reference.The AD5722R/AD5732R/AD5752R use a serial interface that operates at clock rates up to 30 MHz and are compatible with DSP and microcontroller interface standards. Double buffering allows the simultaneous updating of all DACs. The input coding is user-selectable twos complement or offset binary for a bipolar output (depending on the state of Pin BIN/2sComp), and straight binary for a unipolar output. The asynchronous clear function clears all DAC registers to a user-selectable zero-scale or midscale output. 

Features 

1. Complete, dual, 12-/14-/16-bit digital-to-analog converter
2. Operates from single/dual supplies
3. Software programmable output range
+5 V, +10 V, +10.8 V, ±5 V, ±10 V, ±10.8 V
4. INL error: ±16 LSB maximum, DNL error: ±1 LSB maximum
5. Total unadjusted error (TUE): 0.1% FSR maximum
6. Settling time: 10 μs typical
7. Integrated reference: 5 ppm/°C maximum
8. Integrated reference buffers
9. Output control during power-up/brownout
10. Simultaneous updating via LDAC
11. Asynchronous CLRto zero scale or midscale
12. iCMOS process technology

Applications 

1. Industrial automation
2. Closed-loop servo control, process control
3. Automotive test and measurement
4. Programmable logic controllers



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